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Convolutional nets for reconstructing neural circuits from brain images acquired by serial section electron microscopy

Author(s): Lee, Kisuk; Turner, Nicholas; Macrina, Thomas; Wu, Jingpeng; Lu, Ran; et al

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DC FieldValueLanguage
dc.contributor.authorLee, Kisuk-
dc.contributor.authorTurner, Nicholas-
dc.contributor.authorMacrina, Thomas-
dc.contributor.authorWu, Jingpeng-
dc.contributor.authorLu, Ran-
dc.contributor.authorSeung, H Sebastian-
dc.date.accessioned2021-10-08T19:45:15Z-
dc.date.available2021-10-08T19:45:15Z-
dc.date.issued2019-04en_US
dc.identifier.citationLee, Kisuk, Nicholas Turner, Thomas Macrina, Jingpeng Wu, Ran Lu, and H. Sebastian Seung. "Convolutional nets for reconstructing neural circuits from brain images acquired by serial section electron microscopy." Current Opinion in Neurobiology 55 (2019): pp. 188-198. doi:10.1016/j.conb.2019.04.001en_US
dc.identifier.issn0959-4388-
dc.identifier.urihttps://arxiv.org/pdf/1904.12966.pdf-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1zr7m-
dc.description.abstractNeural circuits can be reconstructed from brain images acquired by serial section electron microscopy. Image analysis has been performed by manual labor for half a century, and efforts at automation date back almost as far. Convolutional nets were first applied to neuronal boundary detection a dozen years ago, and have now achieved impressive accuracy on clean images. Robust handling of image defects is a major outstanding challenge. Convolutional nets are also being employed for other tasks in neural circuit reconstruction: finding synapses and identifying synaptic partners, extending or pruning neuronal reconstructions, and aligning serial section images to create a 3D image stack. Computational systems are being engineered to handle petavoxel images of cubic millimeter brain volumes.en_US
dc.format.extent188 - 198en_US
dc.languageengen_US
dc.language.isoen_USen_US
dc.relation.ispartofCurrent Opinion in Neurobiologyen_US
dc.rightsAuthor's manuscripten_US
dc.titleConvolutional nets for reconstructing neural circuits from brain images acquired by serial section electron microscopyen_US
dc.typeJournal Articleen_US
dc.identifier.doi10.1016/j.conb.2019.04.001-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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