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Fast and Balanced: Efficient Label Tree Learning for Large Scale Object Recognition

Author(s): Deng, Jia; Satheesh, Sanjeev; Berg, Alexander C; Li, Fei-Fei

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dc.contributor.authorDeng, Jia-
dc.contributor.authorSatheesh, Sanjeev-
dc.contributor.authorBerg, Alexander C-
dc.contributor.authorLi, Fei-Fei-
dc.date.accessioned2021-10-08T19:45:46Z-
dc.date.available2021-10-08T19:45:46Z-
dc.date.issued2011en_US
dc.identifier.citationDeng, Jia, Sanjeev Satheesh, Alexander C. Berg, and Fei Li. "Fast and Balanced: Efficient Label Tree Learning for Large Scale Object Recognition." Advances in Neural Information Processing Systems 24 (2011): pp. 567-575.en_US
dc.identifier.issn1049-5258-
dc.identifier.urihttps://papers.nips.cc/paper/2011/hash/5a4b25aaed25c2ee1b74de72dc03c14e-Abstract.html-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1zg0p-
dc.description.abstractWe present a novel approach to efficiently learn a label tree for large scale classification with many classes. The key contribution of the approach is a technique to simultaneously determine the structure of the tree and learn the classifiers for each node in the tree. This approach also allows fine grained control over the efficiency vs accuracy trade-off in designing a label tree, leading to more balanced trees. Experiments are performed on large scale image classification with 10184 classes and 9 million images. We demonstrate significant improvements in test accuracy and efficiency with less training time and more balanced trees compared to the previous state of the art by Bengio et al.en_US
dc.format.extent567 - 575en_US
dc.language.isoen_USen_US
dc.relation.ispartofAdvances in Neural Information Processing Systemsen_US
dc.rightsFinal published version. Article is made available in OAR by the publisher's permission or policy.en_US
dc.titleFast and Balanced: Efficient Label Tree Learning for Large Scale Object Recognitionen_US
dc.typeConference Articleen_US
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/conference-proceedingen_US

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