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Rate-distortion dimension of stochastic processes

Author(s): Rezagah, Farideh Ebrahim; Jalali, Shirin; Erkip, Elza; Poor, H Vincent

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dc.contributor.authorRezagah, Farideh Ebrahim-
dc.contributor.authorJalali, Shirin-
dc.contributor.authorErkip, Elza-
dc.contributor.authorPoor, H Vincent-
dc.date.accessioned2020-02-19T22:00:03Z-
dc.date.available2020-02-19T22:00:03Z-
dc.date.issued2016en_US
dc.identifier.citationRezagah, Farideh Ebrahim, Shirin Jalali, Elza Erkip, and H. Vincent Poor. "Rate-distortion dimension of stochastic processes." In 2016 IEEE International Symposium on Information Theory (ISIT), pp. 2079-2083. IEEE, 2016. doi:10.1109/ISIT.2016.7541665en_US
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1jv2j-
dc.description.abstractThe rate-distortion dimension (RDD) of an analog stationary process is studied as a measure of complexity that captures the amount of information contained in the process. It is shown that the RDD of a process, defined as two times the asymptotic ratio of its rate-distortion function R(D) to log 1/D as the distortion D approaches zero, is equal to its information dimension (ID). This generalizes an earlier result by Kawabata and Dembo and provides an operational approach to evaluate the ID of a process, which previously was shown to be closely related to the effective dimension of the underlying process and also to the fundamental limits of compressed sensing. The relation between RDD and ID is illustrated for a piecewise constant process.en_US
dc.format.extent2079 - 2083en_US
dc.language.isoen_USen_US
dc.relation.ispartof2016 IEEE International Symposium on Information Theory (ISIT)en_US
dc.rightsAuthor's manuscripten_US
dc.titleRate-distortion dimension of stochastic processesen_US
dc.typeConference Articleen_US
dc.identifier.doi10.1109/ISIT.2016.7541665-
dc.identifier.eissn2157-8117-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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