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Investigation of the High Electron Affinity Molecular Dopant F6‐TCNNQ for Hole‐Transport Materials

Author(s): Zhang, Fengyu; Kahn, Antoine

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dc.contributor.authorZhang, Fengyu-
dc.contributor.authorKahn, Antoine-
dc.date.accessioned2019-10-04T20:44:03Z-
dc.date.available2019-10-04T20:44:03Z-
dc.date.issued2017en_US
dc.identifier.citationZhang, F, Kahn, A. (2017). Investigation of the High Electron Affinity Molecular Dopant F6‐TCNNQ for Hole‐Transport Materials. Advanced Functional Materials, 28, 1703780. doi:10.1002/adfm.201703780en_US
dc.identifier.issn1616-301X-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1hm9f-
dc.description.abstract2,2′-(perfluoronaphthalene-2,6-diylidene)dimalononitrile (F6-TCNNQ) is investigated as a molecular p-type dopant in two hole-transport materials, 2,2′,7,7′-tetrakis(N,N-diphenylamino)-9,9-spirobifluorene (Spiro-TAD) and tris(4-carbazoyl-9-ylphenyl)amine (TCTA). The electron affinity of F6-TCNNQ is determined to be 5.60 eV, one of the strongest organic molecular oxidizing agents used to date in organic electronics. p-Doping is found to be effective in Spiro-TAD (ionization energy = 5.46 eV) but not in TCTA (ionization energy =5.85 eV). Optical absorption measurements demonstrate that charge transfer is the predominant doping mechanism in Spiro-TAD:F6-TCNNQ. The host–dopant interaction also leads to a significant alteration of the host film morphology. Finally, transport measurements done on Spiro-TAD:F6-TCNNQ as a function of dopant concentration and temperature, and using a highly doped contact layer to ensure negligible hole injection barrier, lead to an accurate measurement of the film conductivity and hole-hopping activation energy.en_US
dc.format.extent1703780 (1 - 8)en_US
dc.language.isoen_USen_US
dc.relation.ispartofAdvanced Functional Materialsen_US
dc.rightsAuthor's manuscripten_US
dc.titleInvestigation of the High Electron Affinity Molecular Dopant F6‐TCNNQ for Hole‐Transport Materialsen_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1002/adfm.201703780-
dc.identifier.eissn1616-3028-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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