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Ultralow doping in organic semiconductors: Evidence of trap filling

Author(s): Olthof, S; Mehraeen, S; Mohapatra, SK; Barlow, S; Coropceanu, V; et al

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dc.contributor.authorOlthof, S-
dc.contributor.authorMehraeen, S-
dc.contributor.authorMohapatra, SK-
dc.contributor.authorBarlow, S-
dc.contributor.authorCoropceanu, V-
dc.contributor.authorBrédas, J-L-
dc.contributor.authorMarder, SR-
dc.contributor.authorKahn, A-
dc.date.accessioned2024-01-21T19:48:16Z-
dc.date.available2024-01-21T19:48:16Z-
dc.date.issued2012-10-26en_US
dc.identifier.citationOlthof, S, Mehraeen, S, Mohapatra, SK, Barlow, S, Coropceanu, V, Brédas, J-L, Marder, SR, Kahn, A. (2012). Ultralow doping in organic semiconductors: Evidence of trap filling. Physical Review Letters, 109 (10.1103/PhysRevLett.109.176601en_US
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1d21rj4p-
dc.description.abstractTail states in organic semiconductors have a significant influence on device performances by acting as traps in charge transport. We present a study of the controlled passivation of acceptor tail states in fullerene C60 by the addition of electrons introduced by molecular n doping. Using ultralow doping, we are able to successively fill the traps with charges and examine the changes in conductivity, activation energy, mobility, and Fermi-level position. Passivation of the traps leads to an increase of the electron mobility in C60 by more than 3 orders of magnitude, to reach 0.21 cm^2 / (V s).en_US
dc.language.isoen_USen_US
dc.relation.ispartofPhysical Review Lettersen_US
dc.rightsAuthor's manuscripten_US
dc.titleUltralow doping in organic semiconductors: Evidence of trap fillingen_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1103/PhysRevLett.109.176601-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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