Ultralow doping in organic semiconductors: Evidence of trap filling
Author(s): Olthof, S; Mehraeen, S; Mohapatra, SK; Barlow, S; Coropceanu, V; et al
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Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Olthof, S | - |
dc.contributor.author | Mehraeen, S | - |
dc.contributor.author | Mohapatra, SK | - |
dc.contributor.author | Barlow, S | - |
dc.contributor.author | Coropceanu, V | - |
dc.contributor.author | Brédas, J-L | - |
dc.contributor.author | Marder, SR | - |
dc.contributor.author | Kahn, A | - |
dc.date.accessioned | 2024-01-21T19:48:16Z | - |
dc.date.available | 2024-01-21T19:48:16Z | - |
dc.date.issued | 2012-10-26 | en_US |
dc.identifier.citation | Olthof, S, Mehraeen, S, Mohapatra, SK, Barlow, S, Coropceanu, V, Brédas, J-L, Marder, SR, Kahn, A. (2012). Ultralow doping in organic semiconductors: Evidence of trap filling. Physical Review Letters, 109 (10.1103/PhysRevLett.109.176601 | en_US |
dc.identifier.uri | http://arks.princeton.edu/ark:/88435/pr1d21rj4p | - |
dc.description.abstract | Tail states in organic semiconductors have a significant influence on device performances by acting as traps in charge transport. We present a study of the controlled passivation of acceptor tail states in fullerene C60 by the addition of electrons introduced by molecular n doping. Using ultralow doping, we are able to successively fill the traps with charges and examine the changes in conductivity, activation energy, mobility, and Fermi-level position. Passivation of the traps leads to an increase of the electron mobility in C60 by more than 3 orders of magnitude, to reach 0.21 cm^2 / (V s). | en_US |
dc.language.iso | en_US | en_US |
dc.relation.ispartof | Physical Review Letters | en_US |
dc.rights | Author's manuscript | en_US |
dc.title | Ultralow doping in organic semiconductors: Evidence of trap filling | en_US |
dc.type | Journal Article | en_US |
dc.identifier.doi | doi:10.1103/PhysRevLett.109.176601 | - |
pu.type.symplectic | http://www.symplectic.co.uk/publications/atom-terms/1.0/journal-article | en_US |
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PhysRevLett.109.176601-accepted.pdf | 491.43 kB | Adobe PDF | View/Download |
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