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Micro-wrinkling and delamination-induced buckling of stretchable electronic structures

Author(s): Oyewole, OK; Yu, D; Du, J; Asare, J; Oyewole, DO; et al

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dc.contributor.authorOyewole, OK-
dc.contributor.authorYu, D-
dc.contributor.authorDu, J-
dc.contributor.authorAsare, J-
dc.contributor.authorOyewole, DO-
dc.contributor.authorAnye, VC-
dc.contributor.authorFashina, A-
dc.contributor.authorZebaze Kana, MG-
dc.contributor.authorSoboyejo, WO-
dc.date.accessioned2021-10-08T20:18:54Z-
dc.date.available2021-10-08T20:18:54Z-
dc.date.issued2015en_US
dc.identifier.citationOyewole, O. K., D. Yu, Jing Du, J. Asare, D. O. Oyewole, V. C. Anye, A. Fashina, M. G. Zebaze Kana, and W. O. Soboyejo. "Micro-wrinkling and delamination-induced buckling of stretchable electronic structures." Journal of Applied Physics 117, no. 23 (2015): 235501. doi:10.1063/1.4922665en_US
dc.identifier.issn0021-8979-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1p278-
dc.descriptionThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Oyewole, O. K., D. Yu, Jing Du, J. Asare, D. O. Oyewole, V. C. Anye, A. Fashina, M. G. Zebaze Kana, and W. O. Soboyejo. "Micro-wrinkling and delamination-induced buckling of stretchable electronic structures." Journal of Applied Physics 117, no. 23 (2015): 235501. and may be found at http://dx.doi.org/10.1063/1.4922665en_US
dc.description.abstractThis paper presents the results of experimental and theoretical/computational micro-wrinkles and buckling on the surfaces of stretchable poly-dimethylsiloxane (PDMS) coated with nano-scale Gold (Au) layers. The wrinkles and buckles are formed by the unloading of pre-stretched PDMS/Au structure after the evaporation of nano-scale Au layers. They are then characterized using atomic force microscopy and scanning electron microscopy. The critical stresses required for wrinkling and buckling are analyzed using analytical models. The possible interfacial cracking that can occur along with film buckling is also studied using finite element simulations of the interfacial crack growth. The implications of the results are discussed for potential applications of micro-wrinkles and micro-buckles in stretchable electronic structures and biomedical devices.en_US
dc.format.extent235501en_US
dc.language.isoen_USen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsFinal published version. Article is made available in OAR by the publisher's permission or policy.en_US
dc.titleMicro-wrinkling and delamination-induced buckling of stretchable electronic structuresen_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1063/1.4922665-
dc.identifier.eissn1089-7550-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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