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Are the Long-Term Unemployed on the Margins of the Labor Market?

Author(s): Krueger, Alan B; Cramer, Judd; Cho, David

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dc.contributor.authorKrueger, Alan B-
dc.contributor.authorCramer, Judd-
dc.contributor.authorCho, David-
dc.date.accessioned2020-04-07T16:48:27Z-
dc.date.available2020-04-07T16:48:27Z-
dc.date.issued2014en_US
dc.identifier.citationKrueger, Alan B, Cramer, Judd, Cho, David. (2014). Are the Long-Term Unemployed on the Margins of the Labor Market?. Brookings Papers on Economic Activity, 2014 (1), 229 - 299. doi:10.1353/eca.2014.0004en_US
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1nz2q-
dc.description.abstractLong-term transition rates calculated from the Current Population Survey, the Survey of Income and Program Participation, and Rutgers University’s Work Trends Survey indicate that the long-term unemployed have a 20 to 40 percent lower probability of being employed 1 to 2 years in the future than do the short-term unemployed. In comparison with the short-term unemployed, for the long-term unemployed the job finding rate is less sensitive to the state of the business cycle, but their labor force withdrawal rate is more procyclical. A calibration exercise finds that the tendency of the labor force withdrawal rate of the long-term unemployed to decline in a recession and then rise in a recovery plays an important role in the well-documented loop around the Beveridge curve. Overall, the results suggest that the longer workers are unemployed, the less attached they become to the labor market.en_US
dc.format.extent229 - 299en_US
dc.language.isoenen_US
dc.relation.ispartofBrookings Papers on Economic Activityen_US
dc.rightsFinal published version. Article is made available in OAR by the publisher's permission or policy.en_US
dc.titleAre the Long-Term Unemployed on the Margins of the Labor Market?en_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1353/eca.2014.0004-
dc.identifier.eissn1533-4465-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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