Absolute x-ray energy calibration and monitoring using a diffraction-based method
Author(s): Hong, Xinguo; Duffy, Thomas S; Ehm, Lars; Weidner, Donald J
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Abstract: | In this paper, we report some recent developments of the diffraction-based absolute X-ray energy calibration method. In this calibration method, high spatial resolution of the measured detector offset is essential. To this end, a remotely controlled long-translation motorized stage was employed instead of the less convenient gauge blocks. It is found that the precision of absolute X-ray energy calibration (ΔE/E) is readily achieved down to the level of 10−4 for high-energy monochromatic X-rays (e.g. 80 keV). Examples of applications to pair distribution function (PDF) measurements and energy monitoring for high-energy X-rays are presented. |
Electronic Publication Date: | 27-Jun-2016 |
Citation: | Hong, Xinguo, Thomas S. Duffy, Lars Ehm, and Donald J. Weidner. "Absolute x-ray energy calibration and monitoring using a diffraction-based method." In AIP Conference Proceedings, AIP Publishing LLC 1741, no. 1, (2016): 050012. doi:10.1063/1.4952932. |
DOI: | doi:10.1063/1.4952932 |
ISSN: | 0094-243X |
EISSN: | 1551-7616 |
Pages: | 050012 |
Type of Material: | Conference Article |
Journal/Proceeding Title: | AIP Conference Proceedings |
Version: | Final published version. This is an open access article. |
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