Skip to main content

Absolute x-ray energy calibration and monitoring using a diffraction-based method

Author(s): Hong, Xinguo; Duffy, Thomas S; Ehm, Lars; Weidner, Donald J

Download
To refer to this page use: http://arks.princeton.edu/ark:/88435/pr1nk4c
Full metadata record
DC FieldValueLanguage
dc.contributor.authorHong, Xinguo-
dc.contributor.authorDuffy, Thomas S-
dc.contributor.authorEhm, Lars-
dc.contributor.authorWeidner, Donald J-
dc.date.accessioned2022-01-25T14:48:51Z-
dc.date.available2022-01-25T14:48:51Z-
dc.identifier.citationHong, Xinguo, Thomas S. Duffy, Lars Ehm, and Donald J. Weidner. "Absolute x-ray energy calibration and monitoring using a diffraction-based method." In AIP Conference Proceedings, AIP Publishing LLC 1741, no. 1, (2016): 050012. doi:10.1063/1.4952932.en_US
dc.identifier.issn0094-243X-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1nk4c-
dc.description.abstractIn this paper, we report some recent developments of the diffraction-based absolute X-ray energy calibration method. In this calibration method, high spatial resolution of the measured detector offset is essential. To this end, a remotely controlled long-translation motorized stage was employed instead of the less convenient gauge blocks. It is found that the precision of absolute X-ray energy calibration (ΔE/E) is readily achieved down to the level of 10−4 for high-energy monochromatic X-rays (e.g. 80 keV). Examples of applications to pair distribution function (PDF) measurements and energy monitoring for high-energy X-rays are presented.en_US
dc.format.extent050012en_US
dc.language.isoen_USen_US
dc.relation.ispartofAIP Conference Proceedingsen_US
dc.rightsFinal published version. This is an open access article.en_US
dc.titleAbsolute x-ray energy calibration and monitoring using a diffraction-based methoden_US
dc.typeConference Articleen_US
dc.identifier.doidoi:10.1063/1.4952932-
dc.date.eissued2016-06-27en_US
dc.identifier.eissn1551-7616-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/conference-proceedingen_US

Files in This Item:
File Description SizeFormat 
Absolute_x-ray_calibration_monitoring_diffraction-based .pdf711.49 kBAdobe PDFView/Download


Items in OAR@Princeton are protected by copyright, with all rights reserved, unless otherwise indicated.