Absolute x-ray energy calibration and monitoring using a diffraction-based method
Author(s): Hong, Xinguo; Duffy, Thomas S; Ehm, Lars; Weidner, Donald J
DownloadTo refer to this page use:
http://arks.princeton.edu/ark:/88435/pr1nk4c
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, Xinguo | - |
dc.contributor.author | Duffy, Thomas S | - |
dc.contributor.author | Ehm, Lars | - |
dc.contributor.author | Weidner, Donald J | - |
dc.date.accessioned | 2022-01-25T14:48:51Z | - |
dc.date.available | 2022-01-25T14:48:51Z | - |
dc.identifier.citation | Hong, Xinguo, Thomas S. Duffy, Lars Ehm, and Donald J. Weidner. "Absolute x-ray energy calibration and monitoring using a diffraction-based method." In AIP Conference Proceedings, AIP Publishing LLC 1741, no. 1, (2016): 050012. doi:10.1063/1.4952932. | en_US |
dc.identifier.issn | 0094-243X | - |
dc.identifier.uri | http://arks.princeton.edu/ark:/88435/pr1nk4c | - |
dc.description.abstract | In this paper, we report some recent developments of the diffraction-based absolute X-ray energy calibration method. In this calibration method, high spatial resolution of the measured detector offset is essential. To this end, a remotely controlled long-translation motorized stage was employed instead of the less convenient gauge blocks. It is found that the precision of absolute X-ray energy calibration (ΔE/E) is readily achieved down to the level of 10−4 for high-energy monochromatic X-rays (e.g. 80 keV). Examples of applications to pair distribution function (PDF) measurements and energy monitoring for high-energy X-rays are presented. | en_US |
dc.format.extent | 050012 | en_US |
dc.language.iso | en_US | en_US |
dc.relation.ispartof | AIP Conference Proceedings | en_US |
dc.rights | Final published version. This is an open access article. | en_US |
dc.title | Absolute x-ray energy calibration and monitoring using a diffraction-based method | en_US |
dc.type | Conference Article | en_US |
dc.identifier.doi | doi:10.1063/1.4952932 | - |
dc.date.eissued | 2016-06-27 | en_US |
dc.identifier.eissn | 1551-7616 | - |
pu.type.symplectic | http://www.symplectic.co.uk/publications/atom-terms/1.0/conference-proceeding | en_US |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Absolute_x-ray_calibration_monitoring_diffraction-based .pdf | 711.49 kB | Adobe PDF | View/Download |
Items in OAR@Princeton are protected by copyright, with all rights reserved, unless otherwise indicated.