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Selectable light-sheet uniformity using tuned axial scanning

Author(s): Duocastella, Martí; Arnold, Craig B; Puchalla, Jason

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dc.contributor.authorDuocastella, Martíen_US
dc.contributor.authorArnold, Craig Ben_US
dc.contributor.authorPuchalla, Jasonen_US
dc.date.accessioned2020-03-31T21:32:26Z-
dc.date.available2020-03-31T21:32:26Z-
dc.date.issued2017-02en_US
dc.identifier.citationDuocastella, Martí, Arnold, Craig B, Puchalla, Jason. (2017). Selectable light-sheet uniformity using tuned axial scanning. Microscopy Research and Technique, 80 (2), 250 - 259. doi:10.1002/jemt.22795en_US
dc.identifier.issn1059-910Xen_US
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1hj51-
dc.format.extent250 - 259en_US
dc.relation.ispartofMicroscopy Research and Techniqueen_US
dc.titleSelectable light-sheet uniformity using tuned axial scanningen_US
dc.typeJournal Article-
dc.identifier.doidoi:10.1002/jemt.22795en_US
dc.date.eissued2016-11-06en_US
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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