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High-Resolution Valley Spectroscopy of Si Quantum Dots

Author(s): Mi, X; Peterfalvi, Csaba G; Burkard, Guido; Petta, Jason R

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dc.contributor.authorMi, X-
dc.contributor.authorPeterfalvi, Csaba G-
dc.contributor.authorBurkard, Guido-
dc.contributor.authorPetta, Jason R-
dc.date.accessioned2018-07-20T15:09:33Z-
dc.date.available2018-07-20T15:09:33Z-
dc.date.issued2017-10-27en_US
dc.identifier.citationMi, X, Peterfalvi, Csaba G, Burkard, Guido, Petta, JR. (2017). High-Resolution Valley Spectroscopy of Si Quantum Dots. PHYSICAL REVIEW LETTERS, 119 (10.1103/PhysRevLett.119.176803en_US
dc.identifier.issn0031-9007-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1wq12-
dc.description.abstractWe study an accumulation mode Si/SiGe double quantum dot (DQD) containing a single electron that is dipole coupled to microwave photons in a superconducting cavity. Measurements of the cavity transmission reveal dispersive features due to the DQD valley states in Si. The occupation of the valley states can be increased by raising the temperature or applying a finite source-drain bias across the DQD, resulting in an increased signal. Using the cavity input-output theory and a four-level model of the DQD, it is possible to efficiently extract valley splittings and the inter- and intravalley tunnel couplings.en_US
dc.language.isoenen_US
dc.relation.ispartofPHYSICAL REVIEW LETTERSen_US
dc.rightsFinal published version. Article is made available in OAR by the publisher's permission or policy.en_US
dc.titleHigh-Resolution Valley Spectroscopy of Si Quantum Dotsen_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1103/PhysRevLett.119.176803-
dc.date.eissued2017-10-24en_US
dc.identifier.eissn1079-7114-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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