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Structural and Electrical Characterization of Bi2Se3 Nanostructures Grown by Metal-Organic Chemical Vapor Deposition

Author(s): Alegria, LD; Schroer, MD; Chatterjee, A; Poirier, GR; Pretko, M; et al

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dc.contributor.authorAlegria, LD-
dc.contributor.authorSchroer, MD-
dc.contributor.authorChatterjee, A-
dc.contributor.authorPoirier, GR-
dc.contributor.authorPretko, M-
dc.contributor.authorPatel, SK-
dc.contributor.authorPetta, Jason R-
dc.date.accessioned2018-07-20T15:11:15Z-
dc.date.available2018-07-20T15:11:15Z-
dc.date.issued2012-09en_US
dc.identifier.citationAlegria, LD, Schroer, MD, Chatterjee, A, Poirier, GR, Pretko, M, Patel, SK, Petta, JR. (2012). Structural and Electrical Characterization of Bi2Se3 Nanostructures Grown by Metal-Organic Chemical Vapor Deposition. NANO LETTERS, 12 (4711 - 4714. doi:10.1021/nl302108ren_US
dc.identifier.issn1530-6984-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1hd5h-
dc.description.abstractWe characterize nanostructures of Bi2Se3 that are grown via metal-organic chemical vapor deposition using the precursors diethyl selenium and trimethyl bismuth. By adjusting growth parameters, we obtain either single-crystalline ribbons up to 10 mu m long or thin micrometer-sized platelets. Four-terminal resistance measurements yield a sample resistivity of 4 m Omega.cm. We observe weak antilocalization and extract a phase coherence length 1(phi) = 178 nm and spin-orbit length l(so) = 93 nm at T = 0.29 K. Our results are consistent with previous measurements on exfoliated samples and samples grown via physical vapor deposition.en_US
dc.format.extent4711 - 4714en_US
dc.language.isoen_USen_US
dc.relation.ispartofNANO LETTERSen_US
dc.rightsAuthor's manuscripten_US
dc.titleStructural and Electrical Characterization of Bi2Se3 Nanostructures Grown by Metal-Organic Chemical Vapor Depositionen_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1021/nl302108r-
dc.date.eissued2012-07-25en_US
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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