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In situ X-Ray Diffraction of Shock-Compressed Fused Silica

Author(s): Tracy, Sally June; Turneaure, Stefan J; Duffy, Thomas S

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dc.contributor.authorTracy, Sally June-
dc.contributor.authorTurneaure, Stefan J-
dc.contributor.authorDuffy, Thomas S-
dc.date.accessioned2022-01-25T14:58:07Z-
dc.date.available2022-01-25T14:58:07Z-
dc.date.issued2018-03-29en_US
dc.identifier.citationTracy, Sally June, Stefan J. Turneaure, and Thomas S. Duffy. "In situ x-ray diffraction of shock-compressed fused silica." Physical review letters 120, no. 13 (2018): 135702. DOI: 10.1103/PhysRevLett.120.135702.en_US
dc.identifier.issn0031-9007-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1cc0ts8p-
dc.description.abstractBecause of its widespread applications in materials science and geophysics, SiO_{2} has been extensively examined under shock compression. Both quartz and fused silica transform through a so-called "mixed-phase region" to a dense, low compressibility high-pressure phase. For decades, the nature of this phase has been a subject of debate. Proposed structures include crystalline stishovite, another high-pressure crystalline phase, or a dense amorphous phase. Here we use plate-impact experiments and pulsed synchrotron x-ray diffraction to examine the structure of fused silica shock compressed to 63 GPa. In contrast to recent laser-driven compression experiments, we find that fused silica adopts a dense amorphous structure at 34 GPa and below. When compressed above 34 GPa, fused silica transforms to untextured polycrystalline stishovite. Our results can explain previously ambiguous features of the shock-compression behavior of fused silica and are consistent with recent molecular dynamics simulations. Stishovite grain sizes are estimated to be ∼5-30  nm for compression over a few hundred nanosecond time scale.en_US
dc.format.extent135702en_US
dc.languageengen_US
dc.language.isoen_USen_US
dc.relation.ispartofPhysical Review Lettersen_US
dc.rightsFinal published version. Article is made available in OAR by the publisher's permission or policy.en_US
dc.titleIn situ X-Ray Diffraction of Shock-Compressed Fused Silicaen_US
dc.typeJournal Articleen_US
dc.identifier.doi10.1103/physrevlett.120.135702-
dc.identifier.eissn1079-7114-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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