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Phase-space measurement for depth-resolved memory-effect imaging

Author(s): Takasaki, KT; Fleischer, Jason W

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dc.contributor.authorTakasaki, KT-
dc.contributor.authorFleischer, Jason W-
dc.date.accessioned2018-07-20T15:11:13Z-
dc.date.available2018-07-20T15:11:13Z-
dc.date.issued2014-07-13en_US
dc.identifier.citationTakasaki, KT, Fleischer, JW. (2014). Phase-space measurement for depth-resolved memory-effect imaging. Optics Express, 22 (31426 - 31433. doi:10.1364/OE.22.031426en_US
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1wq2g-
dc.description.abstractWe use windowed Fourier transforms (spatial spectrograms) to image objects obscured by a thin scattering layer. Such phase-space methods can improve the resolution of the recovered object and allow for estimation of source depth.en_US
dc.format.extent31426 - 31433en_US
dc.language.isoen_USen_US
dc.relation.ispartofOptics Expressen_US
dc.rightsFinal published version. This is an open access article.en_US
dc.titlePhase-space measurement for depth-resolved memory-effect imagingen_US
dc.typeConference Articleen_US
dc.identifier.doidoi:10.1364/OE.22.031426-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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