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Micro-wrinkling and delamination-induced buckling of stretchable electronic structures

Author(s): Oyewole, OK; Yu, D; Du, J; Asare, J; Oyewole, DO; et al

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Abstract: This paper presents the results of experimental and theoretical/computational micro-wrinkles and buckling on the surfaces of stretchable poly-dimethylsiloxane (PDMS) coated with nano-scale Gold (Au) layers. The wrinkles and buckles are formed by the unloading of pre-stretched PDMS/Au structure after the evaporation of nano-scale Au layers. They are then characterized using atomic force microscopy and scanning electron microscopy. The critical stresses required for wrinkling and buckling are analyzed using analytical models. The possible interfacial cracking that can occur along with film buckling is also studied using finite element simulations of the interfacial crack growth. The implications of the results are discussed for potential applications of micro-wrinkles and micro-buckles in stretchable electronic structures and biomedical devices.
Publication Date: 2015
Citation: Oyewole, O. K., D. Yu, Jing Du, J. Asare, D. O. Oyewole, V. C. Anye, A. Fashina, M. G. Zebaze Kana, and W. O. Soboyejo. "Micro-wrinkling and delamination-induced buckling of stretchable electronic structures." Journal of Applied Physics 117, no. 23 (2015): 235501. doi:10.1063/1.4922665
DOI: doi:10.1063/1.4922665
ISSN: 0021-8979
EISSN: 1089-7550
Pages: 235501
Type of Material: Journal Article
Journal/Proceeding Title: Journal of Applied Physics
Version: Final published version. Article is made available in OAR by the publisher's permission or policy.
Notes: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Oyewole, O. K., D. Yu, Jing Du, J. Asare, D. O. Oyewole, V. C. Anye, A. Fashina, M. G. Zebaze Kana, and W. O. Soboyejo. "Micro-wrinkling and delamination-induced buckling of stretchable electronic structures." Journal of Applied Physics 117, no. 23 (2015): 235501. and may be found at http://dx.doi.org/10.1063/1.4922665



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