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Correlation of crystal quality and extreme magnetoresistance of WTe2

Author(s): Ali, Mazhar N; Schoop, Leslie M; Xiong, Jun; Flynn, Steven; Gibson, Quinn; et al

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dc.contributor.authorAli, Mazhar N-
dc.contributor.authorSchoop, Leslie M-
dc.contributor.authorXiong, Jun-
dc.contributor.authorFlynn, Steven-
dc.contributor.authorGibson, Quinn-
dc.contributor.authorHirschberger, Max-
dc.contributor.authorOng, Nai Phuan-
dc.contributor.authorCava, Robert J-
dc.date.accessioned2018-07-20T15:10:52Z-
dc.date.available2018-07-20T15:10:52Z-
dc.date.issued2015-06en_US
dc.identifier.citationAli, Mazhar N, Schoop, Leslie, Xiong, Jun, Flynn, Steven, Gibson, Quinn, Hirschberger, Max, Ong, NP, Cava, RJ. (2015). Correlation of crystal quality and extreme magnetoresistance of WTe2. EPL, 110 (10.1209/0295-5075/110/67002en_US
dc.identifier.issn0295-5075-
dc.identifier.urihttp://arks.princeton.edu/ark:/88435/pr1kh4x-
dc.description.abstractHigh-quality single crystals of WTe2 were grown using a Te flux followed by a cleaning step involving self-vapor transport. The method is reproducible and yields consistently higher-quality single crystals than are typically obtained via halide-assisted vapor transport methods. Magnetoresistance (MR) values at 9 tesla and 2 kelvin as high as 1.75million %, nearly an order of magnitude higher than previously reported for this material, were obtained on crystals with residual resistivity ratio (RRR) of approximately 1250. The MR follows a near B-2 law (B = 1.95(1)) and, assuming a semiclassical model, the average carrier mobility for the highest-quality crystal was found to be 167, 000 cm(2)/Vs at 2K. A correlation of RRR, MR ratio and average carrier mobility (mu(avg)) is found with the cooling rate during the flux growth. editor’s choice Copyright (C) EPLA, 2015en_US
dc.language.isoenen_US
dc.relation.ispartofEPLen_US
dc.rightsFinal published version. This is an open access article.en_US
dc.titleCorrelation of crystal quality and extreme magnetoresistance of WTe2en_US
dc.typeJournal Articleen_US
dc.identifier.doidoi:10.1209/0295-5075/110/67002-
dc.date.eissued2015-06-29en_US
dc.identifier.eissn1286-4854-
pu.type.symplectichttp://www.symplectic.co.uk/publications/atom-terms/1.0/journal-articleen_US

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