To refer to this page use:
|Abstract:||In this study, pressures of ∼5 to ∼8 MPa were applied to organic light emitting diodes containing either evaporated molybdenum trioxide (MoO3) or spin-coated poly(3,4-ethylene dioxythiophene) doped with poly(styrene sulphonate) (PEDOT:PSS) hole-injection layers (HILs). The threshold voltages for both devices were reduced by about half, after the application of pressure. Furthermore, in an effort to understand the effects of pressure treatment, finite element simulations were used to study the evolution of surface contact between the HIL and emissive layer (EML) under pressure. The blister area due to interfacial impurities was also calculated. This was shown to reduce by about half, when the applied pressures were between ∼5 and 8 MPa. The finite element simulations used Young's modulus measurements of MoO3 that were measured using the nanoindentation technique. They also incorporated measurements of the adhesion energy between the HIL and EML (measured by force microscopy during atomic force microscopy). Within a fracture mechanics framework, the implications of the results are then discussed for the pressure-assisted fabrication of robust organic electronic devices.|
|Citation:||Du, Jing, V. C. Anye, E. O. Vodah, T. Tong, M. G. Zebaze Kana, and W. O. Soboyejo. "Pressure-assisted fabrication of organic light emitting diodes with MoO3 hole-injection layer materials." Journal of Applied Physics 115, no. 23 (2014): 233703. doi: 10.1063/1.4881780|
|Type of Material:||Journal Article|
|Journal/Proceeding Title:||Journal of Applied Physics|
|Version:||Final published version. Article is made available in OAR by the publisher's permission or policy.|
|Notes:||This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Du, Jing, V. C. Anye, E. O. Vodah, T. Tong, M. G. Zebaze Kana, and W. O. Soboyejo. "Pressure-assisted fabrication of organic light emitting diodes with MoO3 hole-injection layer materials." Journal of Applied Physics 115, no. 23 (2014): 233703. and may be found at http://dx.doi.org/10.1063/1.4881780|
Items in OAR@Princeton are protected by copyright, with all rights reserved, unless otherwise indicated.