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|Abstract:||This paper presents the results of a combined analytical, computational, and experimental study of adhesion and degradation of Organic Light Emitting Devices (OLEDs). The adhesion between layers that are relevant to OLEDs is studied using an atomic force microscopy technique. The interfacial failure mechanisms associated with blister formation in OLEDs and those due to the addition of TiO2 nanoparticles into the active regions are then elucidated using a combination of fracture mechanics, finite element modeling and experiments. The blisters observed in the models are shown to be consistent with the results from adhesion, interfacial fracture mechanics models, and prior reports of diffusion-assisted phenomena. The implications of the work are then discussed for the design of OLED structures with improved lifetimes and robustness.|
|Citation:||Momodu, D. Y., T. Tong, M. G. Zebaze Kana, A. V. Chioh, and W. O. Soboyejo. "Adhesion and degradation of organic and hybrid organic-inorganic light-emitting devices." Journal of Applied Physics 115, no. 8 (2014): 084504. doi: 10.1063/1.4867051|
|Type of Material:||Journal Article|
|Journal/Proceeding Title:||Journal of Applied Physics|
|Version:||Final published version. Article is made available in OAR by the publisher's permission or policy.|
|Notes:||This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Momodu, D. Y., T. Tong, M. G. Zebaze Kana, A. V. Chioh, and W. O. Soboyejo. "Adhesion and degradation of organic and hybrid organic-inorganic light-emitting devices." Journal of Applied Physics 115, no. 8 (2014): 084504. and may be found at http://dx.doi.org/10.1063/1.4867051|
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